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[IEEE IEEE International Workshop on Imaging Systems and Techniques, 2005 - Niagara Falls, Canada (May 13, 2005)] IEEE International Workshop on Imaging Systems and Techniques, 2005 - Analysis on the effect of tolerance criteria in fractal image compression

✍ Scribed by Poobal, S.; Ravindran, G.

Book ID: 120822046
Publisher: IEEE
Year: 2005
Weight: 121 KB
Category: Article
ISBN-13: 9780780389229
DOI: 10.1109/IST.2005.1594542

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