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[IEEE IEEE International Symposium on Electromagnetic Compatibility - Washington, DC, USA (21-23 Aug. 1990)] IEEE International Symposium on Electromagnetic Compatibility - EM shielding measurement and analysis of nonmetallic materials after and before aging and environmental stresses

✍ Scribed by Fogliati, P.; Rubino, E.

Book ID: 120041609
Publisher: IEEE
Year: 1990
Weight: 307 KB
Category: Article
DOI: 10.1109/ISEMC.1990.252724

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