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[IEEE IEEE International Solid-State Sensors and Actuators Conference - Boston, MA, USA (8-12 June 2003)] TRANSDUCERS '03. 12th International Conference on Solid-State Sensors, Actuators and Microsystems. Digest of Technical Papers (Cat. No.03TH8664) - RF MEMS reliability

✍ Scribed by DeNatale, J.; Mihailovich, R.

Book ID: 120634575
Publisher: IEEE
Year: 2003
Weight: 317 KB
Volume: 2
Category: Article
ISBN-13: 9780780377318
DOI: 10.1109/SENSOR.2003.1216922

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