[IEEE IEEE International SOI Conference - Ponte Vedra Beach, FL (October 6-8, 1992)] IEEE International SOI Conference - Hot-Carrier-Induced Degradation Mechanisms and Anomalous Leakage Current in Hydrogen-Passivated Polysilicon-on-Insulator, LDD p-Mosfet's

✍ Scribed by Bhattacharya, S.; Banerjee, S.; Nguyen, B.-Y.; Tobin, P.

• Book ID: 126750861
• Publisher: IEEE
• Year: 1992
• Weight: 174 KB
• Category: Article
• ISBN-13: 9780780307766
• DOI: 10.1109/SOI.1992.664795