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[IEEE IEEE International SOI Conference - Ponte Vedra Beach, FL (October 6-8, 1992)] IEEE International SOI Conference - Leakage Currents Reduction at the Gate Edge of Sdb Soi Nmos Transistors

โœ Scribed by Sungweon Kang, ; Kwangsoo Kim, ; Dojin Kim, ; Sangwon Kang,


Book ID
120273925
Publisher
IEEE
Year
1992
Weight
136 KB
Category
Article
ISBN-13
9780780307766

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