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[IEEE IEEE International SOC Conference - Portland, OR, USA (17-20 Sept. 2003)] IEEE International [Systems-on-Chip] SOC Conference, 2003. Proceedings. - Analysis of soft error rate in flip-flops and scannable latches

✍ Scribed by Ramanarayanan, R.; Degalahal, V.; Vijaykrishnan, N.; Irwin, M.J.; Duarte, D.

No coin nor oath required. For personal study only.

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