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[IEEE IEEE International Geoscience and Remote Sensing Symposium. IGARSS 2002 - Toronto, Ont., Canada (24-28 June 2002)] Proceedings. International Conference on Image Processing - No-reference sharpness metric based on local edge kurtosis

✍ Scribed by Caviedes, J.; Gurbuz, S.

Book ID: 111963163
Publisher: IEEE
Year: 2002
Tongue: English
Weight: 258 KB
Volume: 1
Category: Article
ISBN-13: 9780780376229
DOI: 10.1109/icip.2002.1038901

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