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[IEEE IEEE International Electron Devices Meeting 2003 - Washington, DC, USA (8-10 Dec. 2003)] IEEE International Electron Devices Meeting 2003 - Writing current reduction for high-density phase-change RAM

✍ Scribed by Hwang, Y.N.; Lee, S.H.; Ahn, S.J.; Lee, S.Y.; Ryoo, K.C.; Hong, H.S.; Koo, H.C.; Yeung, F.; Oh, J.H.; Kim, H.J.; Jeong, W.C.; Park, J.H.; Horii, H.; Ha, Y.H.; Yi, J.H.; Koh, G.H.; Jeong, G.T.; Jeong, H.S.; Kinam Kim,

Book ID: 120027353
Publisher: IEEE
Year: 2003
Weight: 235 KB
Edition: 1
Category: Article
ISBN-13: 9780780378728
DOI: 10.1109/IEDM.2003.1269422

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