✦ LIBER ✦

[IEEE IEEE International Digest on Microwave Symposium - Dallas, TX, USA (8-10 May 1990)] IEEE International Digest on Microwave Symposium - Gate-drain breakdown effects upon the large signal performance of GaAs MESFETs

✍ Scribed by Winslow, T.A.; Fan, D.; Trew, R.J.

No coin nor oath required. For personal study only.

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