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[IEEE IEEE International Conference on Wafer Scale Integration (ICWSI) - San Francisco, CA, USA (18-20 Jan. 1995)] Proceedings IEEE International Conference on Wafer Scale Integration (ICWSI) - Towards WSI testable devices: an improved scan insertion technique

✍ Scribed by Bolchini, C.; Buonanno, G.; Ferrandi, F.; Sciuto, D.; Bombana, M.; Cavalloro, P.; Zaza, G.

Book ID: 126745794
Publisher: IEEE
Year: 1995
Tongue: English
Weight: 650 KB
Category: Article
ISBN-13: 9780780324671
DOI: 10.1109/ICWSI.1995.515468

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