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[IEEE IEEE International Conference on Simulation of Semiconductor Processes and Devices - Boston, MA, USA (2003.09.3-2003.09.5)] International Conference on Simulation of Semiconductor Processes and Devices, 2003. SISPAD 2003. - Random dopant fluctuation modelling with the impedance field method

โœ Scribed by Wettstein, A.; Penzin, O.; Lyumkis, E.; Fichtner, W.


Book ID
125815411
Publisher
IEEE
Year
2003
Tongue
English
Weight
348 KB
Category
Article
ISBN-13
9780780378261

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