𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE IEEE International Conference on Simulation of Semiconductor Processes and Devices - Boston, MA, USA (2003.09.3-2003.09.5)] International Conference on Simulation of Semiconductor Processes and Devices, 2003. SISPAD 2003. - A new comprehensive SRAM soft-effor simulation based on 3D device simulation incorporating neutron nuclear reactions

✍ Scribed by Hane, M.; Kawakami, Y.; Nakamura, H.; Yamada, T.; Kumagai, K.; Watanabe, Y.

Book ID: 120179978
Publisher: IEEE
Year: 2003
Tongue: English
Weight: 452 KB
Category: Article
ISBN-13: 9780780378261
DOI: 10.1109/SISPAD.2003.1233681

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📜 SIMILAR VOLUMES

[IEEE IEEE International Conference on S

[IEEE IEEE International Conference on Simulation of Semiconductor Processes and Devices - Boston, MA, USA (2003.09.3-2003.09.5)] International Conference on Simulation of Semiconductor Processes and Devices, 2003. SISPAD 2003. - Comparison of numerical quantum device models

✍ Kosina, H.; Nedjalkov, M.; Selberherr, S.; Nedjalkov, M. 📂 Article 📅 2003 🏛 IEEE 🌐 English ⚖ 255 KB

[IEEE IEEE International Conference on S

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✍ Bagraev, N.T.; Pavlov, B.S.; Yafyasov, A.M. 📂 Article 📅 2003 🏛 IEEE ⚖ 304 KB