𝔖 Bobbio Scriptorium

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[IEEE IEEE International Conference on Computer Systems and Applications, 2006 - (2006.03.8-2006.03.8)] IEEE International Conference on Computer Systems and Applications, 2006. - Semi-Algorithmic Test Pattern Generation

✍ Scribed by Shahhoseini, H.S.; Kazerouni, B.H.

Book ID: 118271923
Publisher: IEEE
Year: 2006
Weight: 208 KB
Volume: 0
Category: Article
ISBN-13: 9781424402113
DOI: 10.1109/aiccsa.2006.205126

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