[IEEE IEEE Instrumentation and Measurement Technology Conference - Sorrento (2006.04.24-2006.04.27)] 2006 IEEE Instrumentation and Measurement Technology Conference Proceedings - Synthetic Aperture Focusing Technique in High - Frequency Ultrasound Imaging to Locate Layer Delamination

[IEEE 2006 IEEE Instrumentation and Meas

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[IEEE 2006 IEEE Instrumentation and Meas

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[IEEE 2006 IEEE Instrumentation and Meas

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[IEEE 2006 IEEE Instrumentation and Meas

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[IEEE 2006 IEEE Instrumentation and Meas

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