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[IEEE IEEE Instrumentation and Measurement Technology Conference - IMTC '94 - Hamamatsu, Japan (10-12 May 1994)] Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9) - The influence of the penalty factor in order selection criteria

✍ Scribed by Broersen, P.M.T.; Wensink, H.E.

Book ID: 111913900
Publisher: IEEE
Year: 1994
Tongue: English
Weight: 449 KB
Volume: 0
Category: Article
ISBN-13: 9780780318809
DOI: 10.1109/imtc.1994.352172

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