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[IEEE IEEE INDICON 2004. First India Annual Conference, 2004. - Kharagpur, India (Dec. 20-22, 2004)] Proceedings of the IEEE INDICON 2004. First India Annual Conference, 2004. - An efficient algorithm to reduce test power consumption by scan cell and scan vector reordering

โœ Scribed by Reddy, K.V.A.; Chattopadahyay, S.


Book ID
126746598
Publisher
IEEE
Year
2004
Weight
726 KB
Category
Article
ISBN-13
9780780389090

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