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[IEEE IEEE Fifth Working Conference on Current Measurement - St. Petersburg, FL, USA (7-9 Feb. 1995)] Proceedings of the IEEE Fifth Working Conference on Current Measurement - In-situ comparisons of moored acoustic Doppler profilers with conventional VACM and VMCM current meters

โœ Scribed by Irish, J.D.; Plueddemann, A.J.; Lentz, S.J.


Book ID
126769263
Publisher
IEEE
Year
1995
Weight
604 KB
Category
Article
ISBN-13
9780780324374

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