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[IEEE IEEE Custom Integrated Circuits Conference - CICC '94 - San Diego, CA, USA (1-4 May 1994)] Proceedings of IEEE Custom Integrated Circuits Conference - CICC '94 - Diagnosing CMOS bridging faults with stuck-at, IDDQ, and voting model fault dictionaries

✍ Scribed by Millman, S.D.; Acken, J.M.

Book ID: 118221319
Publisher: IEEE
Year: 1994
Weight: 479 KB
Volume: 0
Category: Article
ISBN-13: 9780780318861
DOI: 10.1109/cicc.1994.379692

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