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[IEEE IEEE Custom Integrated Circuits Conference - CICC '93 - San Diego, CA, USA (9-12 May 1993)] Proceedings of IEEE Custom Integrated Circuits Conference - CICC '93 - The impact of hot-electron degradation on CMOS analog subcircuit performance

โœ Scribed by Vei-Han Chan, ; Scharf, B.W.; Chung, J.E.


Book ID
127089027
Publisher
IEEE
Year
1993
Weight
335 KB
Category
Article
ISBN-13
9780780308268

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