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[IEEE IEEE Custom Integrated Circuits Conference 2006 - San Jose, CA, USA (2006.09.10-2006.09.13)] IEEE Custom Integrated Circuits Conference 2006 - Electrical Characteristic Fluctuations in Sub-45nm CMOS Devices

✍ Scribed by Yang, Fu-liang; Hwang, Jiunn-ren; Li, Yiming

No coin nor oath required. For personal study only.

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