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[IEEE IEEE Conference Record - Abstracts. 1999 IEEE International Conference on Plasma Science. 26th International Conference - Monterey, CA, USA (20-24 June 1999)] IEEE Conference Record - Abstracts. 1999 IEEE International Conference on Plasma Science. 26th IEEE International Conference (Cat. No.99CH36297) - Emissive probe characteristic in an inductive plasma source

✍ Scribed by Lho, T.; Hershkowitz, N.; Kim, G.H.; Steer, W.

Book ID: 126752392
Publisher: IEEE
Year: 1999
Weight: 102 KB
Category: Article
ISBN-13: 9780780352247
DOI: 10.1109/PLASMA.1999.829345

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