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[IEEE IEEE Conference Record - Abstracts. 1997 IEEE International Conference on Plasma Science - San Diego, CA, USA (19-22 May 1997)] IEEE Conference Record - Abstracts. 1997 IEEE International Conference on Plasma Science - Laser-induced fluorescence technique for measuring damage to a fluorescent lamp electrode

✍ Scribed by Yunfen Ji, ; Korenowski, G.; Davis, R.

Book ID: 111865955
Publisher: IEEE
Year: 1997
Weight: 97 KB
Edition: 1997
Volume: 0
Category: Article
ISBN-13: 9780780339903
DOI: 10.1109/plasma.1997.604988

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