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[IEEE IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP'94) - Arlington, TX, USA (23-26 Oct. 1994)] Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP'94) - Effect of dopants in single crystal alumina on trapping properties and secondary electron yield

โœ Scribed by Moya, E.G.; Moya, F.; Boukheit, N.; Treheux, D.; Juve, D.; Le Gressus, C.


Book ID
126740777
Publisher
IEEE
Year
1994
Tongue
English
Weight
293 KB
Category
Article
ISBN-13
9780780319509

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