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[IEEE IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP'94) - Arlington, TX, USA (23-26 Oct. 1994)] Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP'94) - Sulfur distribution at the semiconductor-XLPE interfaces of HV cables

✍ Scribed by Houdayer, A.J.; Hinrichsen, P.F.; Parpal, J.-L.; David, E.

Book ID: 118025322
Publisher: IEEE
Year: 1994
Tongue: English
Weight: 408 KB
Volume: 0
Category: Article
ISBN-13: 9780780319509
DOI: 10.1109/ceidp.1994.592028

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