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[IEEE IEEE Computer Society Annual Symposium on VLSI: New Frontiers in VLSI Design (ISVLSI'05) - Tampa, FL, USA (11-12 May 2005)] IEEE Computer Society Annual Symposium on VLSI: New Frontiers in VLSI Design (ISVLSI'05) - PASSAT: Efficient SAT-Based Test Pattern Generation for Industrial Circuits

✍ Scribed by Junhao Shi, ; Fey, G.; Drechsler, R.; Glowatz, A.; Hapke, F.; Schloffel, J.

Book ID: 125416895
Publisher: IEEE
Year: 2005
Weight: 124 KB
Category: Article
ISBN-13: 9780769523651
DOI: 10.1109/ISVLSI.2005.55

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