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[IEEE IEEE 8th Topical Meeting on Electrical Performance of Electronic Packaging - San Diego, CA, USA (25-27 Oct. 1999)] IEEE 8th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No.99TH8412) - Limitations due to systematic phase errors on the extraction of loss tangent from micron-sized transmission line test structures

✍ Scribed by Friar, R.J.; Neikirk, D.P.

Book ID: 121399973
Publisher: IEEE
Year: 1999
Weight: 316 KB
Edition: 1999
Category: Article
ISBN-13: 9780780355972
DOI: 10.1109/EPEP.1999.819195

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