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[IEEE IEEE 43rd Vehicular Technology Conference - Secaucus, NJ, USA (18-20 May 1993)] IEEE 43rd Vehicular Technology Conference - In situ microwave reflection coefficient measurements for smooth and rough exterior wall surfaces

โœ Scribed by Landron, O.; Feuerstein, M.J.; Rappaport, T.S.


Book ID
120535486
Publisher
IEEE
Year
1993
Tongue
English
Weight
451 KB
Category
Article
ISBN-13
9780780312661

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