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[IEEE IEEE 3rd International Conference on Computational Cybernetics, 2005. ICCC 2005. - Mauritius (April 13-16, 2005)] IEEE 3rd International Conference on Computational Cybernetics, 2005. ICCC 2005. - Identifying individual process patterns by means of non-invasive measurements: preliminary results.

โœ Scribed by Colombo, A.; Damiani, E.; Gianini, G.; Scotto, M.; Succi, G.


Book ID
126748146
Publisher
IEEE
Year
2005
Weight
966 KB
Category
Article
ISBN-13
9780780391222

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