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[IEEE IEEE 2005 Custom Integrated Circuits Conference, 2005. - San Jose, CA, USA (Sept. 18-21, 2005)] Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005. - The importance of including thermal effects in estimating the effectiveness of power reduction techniques

✍ Scribed by Ja Chun Ku, ; Ghoneima, M.; Ismail, Y.

Book ID: 126185011
Publisher: IEEE
Year: 2005
Tongue: English
Weight: 186 KB
Category: Article
ISBN-13: 9780780390232
DOI: 10.1109/CICC.2005.1568665

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