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[IEEE IEEE 2001 Custom Integrated Circuits Conference - San Diego, CA, USA (6-9 May 2001)] Proceedings of the IEEE 2001 Custom Integrated Circuits Conference (Cat. No.01CH37169) - Experimental study on MOSFET's flicker noise under switching conditions and modelling in RF applications

✍ Scribed by Zhaofeng Zhang, ; Jack Lau,

Book ID: 121307856
Publisher: IEEE
Year: 2001
Tongue: English
Weight: 384 KB
Category: Article
ISBN-13: 9780780365919
DOI: 10.1109/CICC.2001.929808

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