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[IEEE IEEE 1999 Custom Integrated Circuits Conference - San Diego, CA, USA (16-19 May 1999)] Proceedings of the IEEE 1999 Custom Integrated Circuits Conference (Cat. No.99CH36327) - Measurements and analyses of substrate noise waveform in mixed signal IC environment

✍ Scribed by Nagata, M.; Kashima, Y.; Tamura, D.; Morie, T.; Iwata, A.

Book ID: 126627351
Publisher: IEEE
Year: 1999
Weight: 524 KB
Category: Article
ISBN-13: 9780780354432
DOI: 10.1109/CICC.1999.777347

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