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[IEEE IEEE 1998 National Aerospace and Electronics Conference NAECON 1998. Celebrating 50 Years - Dayton, OH, USA (13-17 July 1998)] Proceedings of the IEEE 1998 National Aerospace and Electronics Conference. NAECON 1998. Celebrating 50 Years (Cat. No.98CH36185) - Adoption of commercial standards in an open system architecture for test system design

✍ Scribed by Schuhmacher, C.; Johnson, P.R.

Book ID: 126732226
Publisher: IEEE
Year: 1998
Weight: 669 KB
Category: Article
ISBN-13: 9780780344495
DOI: 10.1109/NAECON.1998.710116

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