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[IEEE IEEE 1997 National Aerospace and Electronics Conference. NAECON 1997 - Dayton, OH, USA (14-17 July 1997)] Proceedings of the IEEE 1997 National Aerospace and Electronics Conference. NAECON 1997 - Low cost arrangements for scale model RCS and pattern measurements

โœ Scribed by Eskelinen, P.; Harju, P.


Book ID
120089700
Publisher
IEEE
Year
1997
Tongue
English
Weight
411 KB
Volume
2
Category
Article
ISBN-13
9780780337251

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