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[IEEE IEEE 1991 Custom Integrated Circuits Conference - San Diego, CA, USA (12-15 May 1991)] Proceedings of the IEEE 1991 Custom Integrated Circuits Conference - Static charge decay analysis of MOS circuits

✍ Scribed by Bischoff, G.; Razdan, R.

Book ID: 121222364
Publisher: IEEE
Year: 1991
Weight: 344 KB
Category: Article
ISBN-13: 9780780300156
DOI: 10.1109/CICC.1991.164001

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