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[IEEE IEEE 1988 Ultrasonics Symposium Proceedings. - Chicago, IL, USA (2-5 Oct. 1988)] IEEE 1988 Ultrasonics Symposium Proceedings. - Photoelastic characterization of ZnO films

✍ Scribed by Carlotti, G.; Socino, G.; Vernoa, E.

Book ID: 118069155
Publisher: IEEE
Year: 1988
Weight: 278 KB
Volume: 0
Category: Article
DOI: 10.1109/ultsym.1988.49412

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