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[IEEE IECON '93 - 19th Annual Conference of IEEE Industrial Electronics - Maui, HI, USA (15-19 Nov. 1993)] Proceedings of IECON '93 - 19th Annual Conference of IEEE Industrial Electronics - Natural images segmentation for patterns recognition using edges pyramids and its application to the leather defects

✍ Scribed by Limas-Serafim, A.F.

Book ID: 123610621
Publisher: IEEE
Year: 1993
Weight: 451 KB
Category: Article
ISBN-13: 9780780308916
DOI: 10.1109/IECON.1993.339265

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