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[IEEE IECON '90: 16th Annual Conference of IEEE Industrial Electronics Society - Pacific Grove, CA, USA (27-30 Nov. 1990)] [Proceedings] IECON '90: 16th Annual Conference of IEEE Industrial Electronics Society - Study of negative bias on the IGBT's gate

✍ Scribed by Sandali, A.H.; Jaafari, A.; Picard, J.P.

Book ID: 111986925
Publisher: IEEE
Year: 1990
Weight: 321 KB
Volume: 0
Category: Article
ISBN-13: 9780879426002
DOI: 10.1109/iecon.1990.149288

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