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[IEEE IECON 2010 - 36th Annual Conference of IEEE Industrial Electronics - Glendale, AZ, USA (2010.11.7-2010.11.10)] IECON 2010 - 36th Annual Conference on IEEE Industrial Electronics Society - Continuous-conduction-mode charge-pump power-factor-correction electronic ballast with DC-bus voltage stress reduction function

✍ Scribed by Lin, Ray-Lee; Chen, Yen-Yu

Book ID: 118240432
Publisher: IEEE
Year: 2010
Weight: 699 KB
Volume: 0
Category: Article
ISBN: 1424452252
DOI: 10.1109/iecon.2010.5675146

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