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[IEEE ICT'03. 22nd International Conference on Thermoelectrics - La Grande Motte, France (17-21 Aug. 2003)] Proceedings ICT'03. 22nd International Conference on Thermoelectrics (IEEE Cat. No.03TH8726) - Growth of thermoelectric Bi/sub 85/Sb/sub 15/ alloy thin films and their characterization by XRD, TEM & RBS

โœ Scribed by Mallik, R.C.; Rath, S.; Das, V.D.


Book ID
124165108
Publisher
IEEE
Year
2003
Weight
381 KB
Category
Article
ISBN-13
9780780383012

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