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[IEEE ICSE '96. 1996 IEEE International Conference on Semiconductor Electronics. Proceedings - Penang, Malaysia (26-28 Nov. 1996)] ICSE '96. 1996 IEEE International Conference on Semiconductor Electronics. Proceedings - ESD equivalent circuits and simulations-effects on gate oxide breakdown/degradation

✍ Scribed by Teong-San Yeoh, ; Kean-Hong Aw, ; Shze-Jer Hu,

Book ID: 126731489
Publisher: IEEE
Year: 1996
Tongue: English
Weight: 239 KB
Category: Article
ISBN-13: 9780780333888
DOI: 10.1109/SMELEC.1996.616464

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