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[IEEE ICSD'01. Proceedings of the 2001 IEEE 7th International Conference on Solid Dielectrics - Eindhoven, Netherlands (25-29 June 2001)] ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117) - Influence of PD rest time on φ-q-n patterns from voids

✍ Scribed by Ijichi, K.W.T.; Kojima, A.; Komori, F.; Suzuoki, Y.

Book ID: 120210421
Publisher: IEEE
Year: 2001
Tongue: English
Weight: 395 KB
Category: Article
ISBN-13: 9780780363526
DOI: 10.1109/ICSD.2001.955522

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