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[IEEE ICECS 2001. 8th IEEE International Conference on Electronics, Circuits and Systems - Malta (2-5 Sept. 2001)] ICECS 2001. 8th IEEE International Conference on Electronics, Circuits and Systems (Cat. No.01EX483) - ESD test methods on integrated circuits: an overview

✍ Scribed by Ming-Dou Ker, ; Jeng-Jie Peng, ; Hsin-Chin Jiang,

Book ID: 127351236
Publisher: IEEE
Year: 2001
Tongue: English
Weight: 458 KB
Volume: 2
Category: Article
ISBN-13: 9780780370579
DOI: 10.1109/icecs.2001.957647

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