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[IEEE ICECS 2000. 7th IEEE International Conference on Electronics, Circuits and Systems - Jounieh, Lebanon (17-20 Dec. 2000)] ICECS 2000. 7th IEEE International Conference on Electronics, Circuits and Systems (Cat. No.00EX445) - Relation between MOSFET degradation and interface-states generation

✍ Scribed by Gnenifi, N.; Djahli, F.; Mayouf, A.

Book ID: 120193007
Publisher: IEEE
Year: 2000
Tongue: English
Weight: 377 KB
Volume: 2
Category: Article
ISBN-13: 9780780365421
DOI: 10.1109/ICECS.2000.913030

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