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[IEEE ICCAD 2004. International Conference on Computer Aided Design - San Jose, CA, USA (7-11 Nov. 2004)] IEEE/ACM International Conference on Computer Aided Design, 2004. ICCAD-2004. - Variability in sub-100nm SRAM designs

โœ Scribed by Heald, R.; Wang, P.


Book ID
126638986
Publisher
IEEE
Year
2004
Weight
437 KB
Category
Article
ISBN-13
9780780387027

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