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[IEEE IAS '97. Conference Record of the 1997 IEEE Industry Applications Conference Thirty-Second IAS Annual Meeting - New Orleans, LA, USA (5-9 Oct. 1997)] IAS '97. Conference Record of the 1997 IEEE Industry Applications Conference Thirty-Second IAS Annual Meeting - The effect of measuring system accuracy on power quality measurements in electrical arc furnaces

✍ Scribed by Boulet, B.; Wikston, J.; Kadar, L.

Book ID: 121354317
Publisher: IEEE
Year: 1997
Weight: 388 KB
Edition: 1997
Volume: 3
Category: Article
ISBN-13: 9780780340671
DOI: 10.1109/IAS.1997.626365

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