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[IEEE Frequency Control Symposium - New Orleans, LA, USA (29-31 May 2002)] Proceedings of the 2002 IEEE International Frequency Control Symposium and PDA Exhibition (Cat. No.02CH37234) - Finite element analysis of activity-dips in BAW resonators and sensors

✍ Scribed by Dulmet, B.

Book ID: 121339195
Publisher: IEEE
Year: 2002
Weight: 935 KB
Category: Article
ISBN-13: 9780780370821
DOI: 10.1109/FREQ.2002.1075876

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