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[IEEE Fourth IEEE International Caracas Conference on Devices, Circuits and Systems - Oranjestad, Aruba, Netherlands (17-19 April 2002)] Proceedings of the Fourth IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.02TH8611) - The influence and modeling of process variation and device mismatch for analog/rf circuit design

✍ Scribed by Yuhua Cheng,

Book ID: 118053193
Publisher: IEEE
Year: 2002
Weight: 695 KB
Volume: 0
Category: Article
ISBN-13: 9780780373808
DOI: 10.1109/iccdcs.2002.1004068

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