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[IEEE Forty-Eighth IEEE Holm Conference on Electrical Contacts - Orlando, FL, USA (21-23 Oct. 2002)] Proceedings of the Forty-Eighth IEEE Holm Conference on Electrical Contacts - Gassing arc chamber wall material effect on post current-zero recovery voltage breakdown

✍ Scribed by Shea, J.J.

Book ID: 121231425
Publisher: IEEE
Year: 2002
Weight: 819 KB
Category: Article
ISBN-13: 9780780374331
DOI: 10.1109/HOLM.2002.1040825

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