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[IEEE First Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems - Ann Arbor, MI, USA (17-18 Sept. 1998)] 1998 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems. Digest of Papers (Cat. No.98EX271) - Experimental determination of minority electron mobility in p-type pseudomorphic SiGe/Si

✍ Scribed by Rieh, J.-S.; Lu, L.-H.; Katehi, L.P.B.; Bhattacharya, P.K.

Book ID: 126745183
Publisher: IEEE
Year: 1998
Weight: 521 KB
Category: Article
ISBN-13: 9780780352889
DOI: 10.1109/SMIC.1998.750169

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