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[IEEE First International Symposium on Empirical Software Engineering and Measurement (ESEM 2007) - Madrid, Spain (2007.09.20-2007.09.21)] First International Symposium on Empirical Software Engineering and Measurement (ESEM 2007) - An Approach to Outlier Detection of Software Measurement Data using the K-means Clustering Method

✍ Scribed by Yoon, Kyung-A; Kwon, Oh-Sung; Bae, Doo-Hwan

Book ID: 120812283
Publisher: IEEE
Year: 2007
Weight: 315 KB
Category: Article
ISBN: 0769528864
DOI: 10.1109/ESEM.2007.49

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